Figure 2

AFM and SEM Images of the surface topography on wrinkled, selectively crazed acetone-etched channels, and crazed microchips. a) AFM image shows the wrinkled topography developed using a 15 nm gold layer having an average wrinkle channel width of about 320 nm. Scale = 5 μm. b) SEM image of wrinkled topography produced using a 30 nm gold layer. Scale = 50 μm. The average wrinkle channel width is about 510 nm. Right corner: AFM image of the same, scale = 5 μm. c) Acetone-etched topography has an average channel width distance of about 10.5 μm. Etch lines are traveling parallel to each other after biaxial shrinking. Scale = 200 μm. d) Crazed topography developed after shrinking with channels about 20 μm in width. Scale = 200 μm. e) Table summarizing the dimensions of the four topographical surfaces.